The Dakota FX70-DL and FX71-DL are portable ultrasonic flaw detectors with A-Scan, B-Scan and dual mode flaw + thickness. A complete solution for field inspections.
- Portable : For field inspections
- Dual mode : Flaws and thickness
- A-Scan B-Scan : Display and mapping
- DAC TCG : Automatic compensation curves
- Built-in datalogger : Extended memory in the field
- Pulse-Echo Pitch-Catch : Standard NDT techniques
- P/N Z-221-0005 : Official Dakota part number
The Dakota FX70-DL and FX71-DL are ultrasonic flaw detectors in a portable format, designed for field inspections of welds, castings and mechanical components. They combine flaw detection and thickness measurement in a single rugged instrument, with full traceability and a backlit display, Versatile instruments covering both flaw detection and thickness measurement.
On this page
- Positioning within the Dakota range
- Dual functionality: flaw detector + thickness gauge
- When to choose the Dakota FX70-DL
- Flaw detection modes
- Main features
- Technical specifications
- Typical applications
- Scope of supply
- Order codes: instrument, probes and accessories
- Documentation download
- Standards and certifications
- Frequently asked questions
Distinctive features include A-Scan display and B-Scan, DAC and TCG curves for flaw evaluation, Pulse-Echo and Pitch-Catch techniques, a datalogger for documented inspections and a USB output. Compatible with the Dakota transducer range, single and angle-beam, for NDT applications on steel and metal alloys, Dedicated software allows structured archiving of inspections and the generation of technical reports.
Portable Ultrasonic Flaw Detector
Suitable for weld inspection to industry standards (including AWS D1), inspections on aerospace components, pipelines and metal structures. Available from RODER SRL, official Dakota NDT distributor, with dedicated calibration, repair and technical support. P/N Z-221-0005. Also recommended for mobile inspection services operating across several industrial sites.
The Dakota FX70-DL (currently marketed as the FX71-DL, P/N Z-221-0005, technical designation DFX-7+) is the portable ultrasonic flaw detector in the Dakota NDT range. A two-in-one instrument combining advanced flaw detection functions (with Zero Crossing, Flank, Peak, TRIG, DAC, TCG detection modes) and thickness measurement with simultaneous coating and material capability. 4 GB memory with A-Scans and B-Scans stored in alphanumeric batches, full data logger, USB transfer to PC via DakMaster™. The instrument is EN 12668-1 compliant, the European reference standard for ultrasonic flaw detection equipment.
Need help choosing the right product?
Positioning within the Dakota range
The Dakota FX70-DL is the entry instrument in the Flaw Detector category of the Dakota NDT range. It shares its technology base with the FX81-DL benchtop model (both are developments of the DFX platform), but is characterised by its portable form factor — 397 g, dimensions 63.5 × 165 × 31.5 mm, powered by 3 AA batteries — ideal for field inspections, welds in awkward positions, access-constrained work.
Note on naming: the Dakota portable flaw detector range has been updated. The FX71-DL model is the current development of the FX70-DL and retains the same DFX-7+ platform with firmware updates. The official Dakota P/N is Z-221-0005.
Dual functionality: flaw detector + thickness gauge
Flaw Detector mode
Configured as a flaw detector, the FX70-DL makes it possible to determine the size and position of flaws in materials and welded joints, and to differentiate between flaw types through A-Scan waveform analysis. It supports normal probes (0°) and angle beam transducers for weld inspection to AWS D1.1, EN ISO 17640, ASME Sect. V.
Thickness Gauge mode
Configuring the FX70-DL as a thickness gauge makes it possible to carry out simultaneous measurements of coating and base material thickness — an advanced capability that normally requires separate instruments.
When to choose the Dakota FX70-DL
Flaw detection modes
The FX70-DL offers five configurable detection modes:
Zero Crossing
The gate detects the flank of the pulse but the measurement is taken at the next crossing of the X axis. This is the most common mode in ultrasonic measurement because of its stability against amplitude variations.
Flank
The gate is triggered by the flank of the pulse on the graph and the measurement is taken at that exact point. Indicated when maximum time resolution is required.
Peak
The gate is triggered by the intersection with the A-Scan pulse and detection is taken at the next peak of the signal (when it stops rising and begins to fall).
TRIG
TRIG (Trigonometric) mode allows 2D flaw location in terms of surface distance and depth. Used with angle beam transducers, it displays the beam path, depth and surface distance graphically and applies curved surface correction. Essential for weld inspection to AWS D1.1.
DAC (Distance Amplitude Correction)
Distance-amplitude correction for creating DAC curves that give the operator a sensitivity reference against flaws of known size at different distances. Essential for classifying detected flaws against the acceptance criteria of AWS, ASME and ISO.
TCG (Time Corrected Gain)
TCG automatically increases gain as distance increases in order to obtain uniform sensitivity for the same reflector at different depths. The FX70-DL applies TCG automatically to compensate for ultrasonic attenuation through the material, extending performance on heavy wall thicknesses.
Main features
- 2-in-1 platform: flaw detector + thickness gauge
- 5 detection modes: Zero Crossing, Flank, Peak, TRIG, DAC
- Automatic TCG for attenuation compensation
- Customisable toolkits for different applications
- A-Scan display (standard flaw detector)
- Cross-sectional B-Scan display
- 4 GB memory with A-Scan and B-Scan archiving in batches
- Alphanumeric batches with full data logging
- Configurable pass/fail limits with audible/visual alarms
- Thickness measurement capability with coating and material simultaneously
- USB transfer to PC with DakMaster™ software
- Firmware update via USB/DakMaster™
- Hybrid power supply: 3 × AA or USB
- Battery life: 12 hours on alkaline cells
- Temperature range: -10 ÷ +60 °C
- Compact body 397 g
- NIST-traceable calibration certificate supplied as standard
- EN 12668-1 compliance (European standard for flaw detectors)
Technical specifications
| Parameter | Value |
| Part Number | Z-221-0005 |
| Technical designation | DFX-7+ (evoluzione FX71-DL) |
| Function | Flaw Detector + Thickness Gauge |
| Detection modes | Zero Crossing, Flank, Peak, TRIG, DAC |
| Time Corrected Gain | Yes, automatic |
| A-Scan | Yes |
| B-Scan | Yes |
| Memory | 4 GB internal |
| Logging | Alphanumeric batches with A-Scan/B-Scan for every measurement |
| Pass/fail limits | Configurable with alarms |
| Data output | USB a PC |
| Software | DakMaster™ |
| Firmware update | Via USB |
| Operating temperature | -10 ÷ +60 °C (14 ÷ 140 °F) |
| Power supply | 3 × AA + via USB |
| Battery life | 12 h alkaline / 5 h NiCd / 12 h NiMH |
| Weight | 397 g (with batteries) |
| Dimensions | 63.5 × 165 × 31.5 mm |
Typical applications
- Structural weld inspection to AWS D1.1, ISO 17640, ASME Sect. V
- Production quality control of castings, forgings and plate
- Predictive maintenance of pressure vessels, piping and heat exchangers
- Inspection of welded structures: bridges, tanks, offshore platforms
- Aerospace industry: inspection of structural components
- Rail sector: inspection of rails, axles and welds
- Automotive industry: integrity checks on structural parts
- Infrastructure maintenance: pipelines, dams, steel structures
- Fatigue crack detection
- Flaw characterisation (shape/size classification)
Recommended application guides:
- Ultrasonic weld inspection to AWS D1.1 with the Dakota FX70-DL
- AWS D1.1 and ultrasonic weld inspection: requirements and instruments
- API 570 and API 653: instrumentation requirements
- How to choose the right ultrasonic transducer
- Data logger vs manual recording
Scope of supply
- Dakota FX70-DL / FX71-DL instrument
- Ultrasonic couplant
- User manual
- Rigid carrying case
- NIST traceable calibration certificate
- 3 AA batteries
- USB cable
- DakMaster™ software
Note: the probe is not included in the standard kit. For sizing the optimum probe for Your application (weld inspection, crack detection, thickness measurement), contact us.
Order codes: instrument, probes and accessories
Below you will find everything you can order for the FX71-DL: the instrument, compatible probes, couplants, calibration blocks and accessories. Please quote the order code in your request: it is the code shown on the quotation and on the order confirmation.
The probe is not included with the instrument: it must be chosen and ordered separately from those listed on this page. All probes in the table are compatible with the FX71-DL.
Instrument
Supplied with: FX71-DL instrument, ultrasonic couplant, manual, plastic carrying case, calibration certificate, AA batteries, PC software and data transfer cable. Probe not included.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | Z-221-0005 | 10-16-26 | Difettoscopio portatile FX71-DL (DFX-7+) Probe to be ordered separately |
Compatible probes
Flaw detection probes: single-element contact probes (Hi-Wear and Finger Tip) for longitudinal waves, Standard and Quick Change shear-wave angle probes (these require the wedge, see below) and integral probes for welds. Frequency and size are chosen according to the thickness and geometry of the part.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | T-8040-0868 | 10-16-38 | Single-element contact probe Hi-Wear, composite crystal, 1 MHz, Ø 1/2″, BNC connector |
 | T-8070-0868 | 10-16-39 | Single-element contact probe Hi-Wear, composite crystal, 1 MHz, Ø 1″, connector BNC |
 | T-8040-1878 | 10-16-40 | Single-element contact probe Hi-Wear, composite crystal, 2.25 MHz, Ø 1/2″, BNC connector |
 | T-8070-1878 | 10-16-41 | Single-element contact probe Hi-Wear, composite crystal, 2.25 MHz, Ø 1″, BNC connector |
 | T-8040-2878 | 10-16-42 | Single-element contact probe Hi-Wear, composite crystal, 5 MHz, Ø 1/2″, BNC connector |
 | T-8070-2878 | 10-16-43 | Single-element contact probe Hi-Wear, composite crystal, 5 MHz, Ø 1″, BNC connector |
 | T-4023-1855 | 10-15-70 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 1/4″, connector Microdot, side exit |
 | T-4033-1855 | 10-15-69 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 3/8″, connector Microdot, side exit |
 | T-4043-1855 | 10-15-71 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-4023-2855 | 10-15-56 | Single-element contact probe Finger Tip, 5 MHz, Ø 1/4″, connector Microdot, side exit |
 | T-4033-2855 | 10-15-72 | Single-element contact probe Finger Tip, 5 MHz, Ø 3/8″, connector Microdot, side exit |
 | T-4043-2855 | 10-15-73 | Single-element contact probe Finger Tip, 5 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-4023-4855 | 10-15-57 | Single-element contact probe Finger Tip, 10 MHz, Ø 1/4″, Microdot connector, side exit |
 | T-4043-4855 | 10-15-58 | Single-element contact probe Finger Tip, 10 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-5903-2875 | 10-15-75 | Single-element contact probe Finger Tip Slim Line (non-magnetic), 5 MHz, Ø 1/8″, connector Microdot, top exit |
 | T-5903-4875 | 10-15-76 | Single-element contact probe Finger Tip Slim Line, 10 MHz, Ø 1/8″, connector Microdot, top exit |
 | T-8044-1848 | 10-16-44 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 2.25 MHz, 1/2″ x 1/2″ |
 | T-8054-1848 | 10-16-45 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 2.25 MHz, 5/8″ x 5/8″ |
 | T-8044-2848 | 10-16-46 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 5 MHz, 1/2″ x 1/2″ |
 | T-8054-2848 | 10-16-47 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 5 MHz, 5/8″ x 5/8″ |
 | T-5035-1845 | 10-16-57 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 2.25 MHz, Ø 3/8″, Microdot connector |
 | T-5045-1845 | 10-16-58 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 2.25 MHz, Ø 1/2″, Microdot connector |
 | T-5025-2845 | 10-16-59 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 1/4″, Microdot connector |
 | T-5035-2845 | 10-16-60 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 3/8″, Microdot connector |
 | T-5045-2845 | 10-16-61 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 1/2″, Microdot connector |
 | T-5025-4845 | 10-16-62 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 10 MHz, Ø 1/4″, Microdot connector |
 | TF4M0045 | 10-15-97 | Integral-wedge shear-wave probe 4 MHz, 45°, Ø 10 mm, Lemo 00 – weld inspection / prove-up |
 | TF4M0070 | 10-16-73 | Integral-wedge shear-wave probe 4 MHz, 70°, Ø 10 mm, Lemo 00 – weld inspection |
 | TF5M00F | 10-16-74 | Dual-element probe 5 MHz, 0°, Ø 10 mm, Lemo 00, short focus – weld lamination testing |
Wedges
Wedges for angle-beam probes: choose the angle and the size of the probe in use.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | X-004-0014 | 10-16-48 | Standard wedge for Standard (SS) shear-wave probes, 45°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0020 | 10-16-49 | Standard wedge for Standard (SS) shear-wave probes, 45°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0015 | 10-16-50 | Standard wedge for Standard (SS) shear-wave probes, 60°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0021 | 10-16-51 | Standard wedge for Standard (SS) shear-wave probes, 60°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0016 | 10-16-52 | Standard wedge for Standard (SS) shear-wave probes, 70°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0022 | 10-16-53 | Standard wedge for Standard (SS) shear-wave probes, 70°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0023 | 10-16-54 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 45°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0024 | 10-16-55 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 60°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0025 | 10-16-56 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 70°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0038 | 10-16-63 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 1/4″ Wedge only: probe NOT included |
 | X-004-0041 | 10-16-64 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0044 | 10-16-65 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 1/2″ Wedge only: probe NOT included |
 | X-004-0042 | 10-16-67 | Standard Quick Change wedge for QC shear-wave probes, 60°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0045 | 10-16-68 | Standard Quick Change wedge for QC shear-wave probes, 60°, Ø 1/2″ Wedge only: probe NOT included |
 | X-004-0040 | 10-16-69 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 1/4″ Wedge only: probe NOT included |
 | X-004-0043 | 10-16-70 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0046 | 10-16-71 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 1/2″ Wedge only: probe NOT included |
Probe cables
Cables connecting single-element probes to the instrument.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | N-104-0020 | 14-16-00 | Probe cable 1.2 m single Lemo 00 – Microdot |
 | N-104-0070 | 10-16-19 | Probe cable 1.2 m single Lemo 00 – BNC |
 | N-104-0000 | 10-16-03 | Probe cable 1.2 m single Lemo 00 – Lemo 00 (prove-up probes) |
 | N-204-0020 | 10-16-20 | Probe cable 1.2 m dual Lemo – Microdot |
 | N-204-0000 | 10-16-22 | Probe cable 1.2 m dual Lemo – Lemo |
 | TL-31897-60 | 10-16-75 | Probe cable 1.5 m Lemo 00 – Lemo 00 |
Couplants
A couplant is included in the supply; for refills and for high temperatures, choose from the following.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | GEL-ACC-STD | 12-13-50 | Yellow anti-rust couplant gel, RCCM compliant. Standard temperature range 0 / 80 °C. 500 ml pack |
 | GEL-ACC-EXT | 12-13-51 | Blue anti-corrosion couplant gel, RCCM compliant. Extended temperature range -20 / 120 °C. 500 ml pack |
 | PST-ACC-UHT | 12-13-53 | Special very-high-temperature ultrasonic coupling paste +100 / 520 °C. Non-flammable and smoke-free. RCCM compliant. 200 g pack |
 | T92024034-9 | 10-15-82 | High-temperature ultrasonic couplant (370 °C), 60 ml |
 | T92024034-10 | 10-15-83 | High-temperature ultrasonic couplant (370 °C), 60 ml, pack of 2 |
Accessories and spare parts
Cases, cables and accessories specific to this instrument.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | F-149-0001 | 10-15-64 | Nylon instrument case (MX, PMX, CMX, MVX, PVX, MMX, FX71, BT1 / MINI-MAX) Case only: instrument NOT included |
 | A-149-6002 | 10-15-65 | Rubber instrument boot (MX, PMX, CMX, MVX, PVX, MMX, FX71, BT1- DL v2.0) Case only: instrument NOT included |
 | A-100-6003 | 10-15-66 | Plastic carrying case (MX, PMX, CMX, MVX, PVX, MMX, FX71, BT1) Case only: instrument NOT included |
| N-003-0330 | 10-15-39 | USB-C / USB-A data cable 0.9 m (V2.0 instruments) |
For more on choosing the probe: probes for flaw detectors and the guide How to choose the right ultrasonic transducer. For a quotation, please state the order code and quantity.
Documentation download
Official Dakota NDT technical documentation. Files open in a new tab.
- Weld inspection with angle beam probes (AWS D1.1, ISO 17640)
- Crack detection in steel structures
- In-service inspection of critical components (pressure vessels, piping, welded structures)
- The need for a single instrument for flaw detection + thickness gauging
- Infrastructure maintenance: bridges, pipelines, load-bearing structures
- Production quality control: integrity checks on castings, forgings and welded parts
- Field inspections requiring a portable battery-powered instrument
- Users requiring full EN 12668-1 compliance for certification
- Users requiring complete A-Scan + B-Scan archiving for reporting
Standards and certifications
- EN 12668-1 — European standard for ultrasonic flaw detection equipment (compliance declared by Dakota)
- NIST traceable factory calibration
- MIL-STD-45662A compliance
- CE marking and EMC compliance
- Thickness gauge mode compliant with ASTM E797 and EN 14127
- Calibration certificate supplied as standard
For the regulatory framework see NDT standards for thickness measurement and AWS D1.1 and ultrasonic weld inspection.
Frequently asked questions
The FX71-DL is the current development of the FX70-DL / DFX-7 platform with firmware and hardware updates. The Dakota commercial P/N is now Z-221-0005 with the DFX-7+ designation. The features described on this page reflect the current version of the instrument.
The FX70-DL is portable (397 g, 3 × AA, 63.5 × 165 × 31.5 mm) for field inspections. The FX81-DL is a benchtop unit for laboratory or fixed-station inspection, with extended battery life and a larger display. Both share the DFX platform and the detection modes.
Yes, the FX70-DL is declared EN 12668-1 compliant by Dakota. EN 12668-1 is the European reference standard for the characterisation and verification of ultrasonic flaw detection equipment and is required for certification in inspections to EN ISO 17640 and equivalent standards.
Yes. The FX70-DL is a 2-in-1 instrument: configured as a thickness gauge it measures material and coating thickness simultaneously. However, for thickness-only applications we recommend the dedicated gauges in the CMX, MX or PMX ranges, which offer ergonomics optimised for repetitive measurement.
TRIG is a geometric function: it calculates the position and depth of flaws from angle beam probes by applying trigonometry to the beam path. DAC is an amplitude correction function: it creates sensitivity curves against distance in order to classify flaw size. The two are often used together when inspecting welds with angle beam probes.
Yes. With 4 GB of internal memory the FX70-DL stores the A-Scans and B-Scans associated with each measurement in alphanumeric batches. DakMaster™ software makes it possible to review the waveforms in the laboratory for in-depth analysis and to generate professional reports.
Request a tailored quotation for the Dakota FX70-DL / FX71-DL
We will help You choose the optimum probe for Your application (weld inspection, crack detection, thickness measurement) and configure the kit. Contact us for dedicated technical advice or to arrange a demonstration.
Further information and contacts
Systems division and sensor integration partner : www.roder.it
More information about RODER SRL : about us
Contact for general information : info@roder.it
Contact for information about these products : info@roder.it
The information contained on this web page is provided for information purposes only. Although it has been compiled with the utmost care, it does not constitute a contractual offer or a binding commitment to supply. It may contain transcription, translation or typographical errors. For precise and up-to-date information, please contact our company directly.
Some images on this website have been intentionally generated using Artificial Intelligence (AI). This is because, for many applications and projects, it is not possible to disclose photographs of the installation or of the actual system due to confidentiality agreements, confidentiality clauses and non-disclosure agreements (NDAs).