The Dakota FX81-DL is the flaw detector ultrasonic benchtop unit with large display, A-Scan, B-Scan and dual mode flaw detection and thickness measurement. A professional instrument for the laboratory.
- Dual mode : Flaws and thickness
- A-Scan : Waveform display
- B-Scan : Real-time flaw profile
- Large display: High-contrast reading
- DAC TCG : Automatic compensation curves
- Extended datalogger : Full inspection traceability
- P/N Z-251-0001 : Official Dakota part number
The Dakota FX81-DL is an ultrasonic flaw detector in a benchtop version, designed for laboratory and workshop applications that call for a large display and complete diagnostic capabilities. It combines flaw detection and thickness measurement in a single instrument, with professional traceability of inspections, Designed for certified NDT inspectors and quality managers in industrial laboratories.
On this page
- Positioning within the Dakota Flaw Detector range
- When to choose the Dakota FX81-DL
- Main features
- Flaw detection modes
- Technical specifications
- FX70-DL vs FX81-DL comparison
- Typical applications
- Scope of supply
- Order codes: instrument, probes and accessories
- Documentation download
- Standards and certifications
- Frequently asked questions
Key features include A-Scan display and B-Scan, DAC and TCG curves for flaw evaluation, dual mode flaw + thickness operation, extended datalogger with structured inspection organisation and USB output. Compatible with the Dakota transducer range, dual and single element, for diverse NDT applications, Large display and interface optimised for extended analysis at a fixed workstation.
Benchtop Flaw Detector
Suitable for non-destructive testing in NDT laboratories, machine shops, weld inspection, castings and aerospace components. Available from RODER SRL, official distributor of Dakota NDT, with dedicated calibration, repair and technical support. P/N Z-251-0001, the reference solution for professional testing, Reference instrument for inspection services carrying out highly complex operations.
The Dakota FX81-DL (P/N Z-251-0001, technical designation DFX-8+) is the benchtop ultrasonic flaw detector in the Dakota NDT range — an instrument for the laboratory or fixed workstation that brings the same advanced flaw detection technology as the portable FX70-DL / FX71-DL model in a larger form factor, with a bigger display, extended operating time (Li-Ion pack of about 18 hours, 6 emergency AA batteries, 12 V power supply) and performance optimised for intensive use in controlled environments. Compliant with EN 12668-1, it supports all detect modes (Zero Crossing, Flank, Peak, TRIG, DAC, TCG) and has 4 GB of internal memory, expandable up to 64 GB, with A-Scan/B-Scan in alphanumeric batches and grid batching with OBSTRUCT flag.
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Positioning within the Dakota Flaw Detector range
The Dakota Flaw Detector range comprises two models with different form factors, intended for different operating contexts but built on the same DFX technology:
- FX70-DL / FX71-DL portable (397 g, 3×AA, P/N Z-221-0005) for field inspections, difficult access and in-service maintenance
- Benchtop FX81-DL (2.04 kg, Li-Ion + 12 V power supply, P/N Z-251-0001) for the laboratory, quality control in production, training and repetitive inspections from a fixed workstation
The measurement modes, detect formats and software are the same: both models generate compatible data that can be processed with the same DakMaster™ — enabling integrated workflows between field inspection (FX70) and laboratory analysis (FX81).
When to choose the Dakota FX81-DL
- Quality control laboratories in production — repetitive inspection of castings, forgings and welds
- NDT training centres (Level I/II/III personnel training) — larger display, bench ergonomics
- Production inspections with parts brought to the laboratory after machining
- Certification workshops for welded components (AWS, ISO, ASME)
- Research & Development: characterisation of new materials, process validation
- Need for long operating time: the Li-Ion pack provides about 18 hours of continuous use
- Use on mains power (12 V / 2 A power supply) for unlimited sessions
- Users who prefer a fixed workstation with only occasional transport in a carrying case
- Users who want maximum display legibility for in-depth analysis
Main features
- 2-in-1 platform: flaw detector + thickness gauge
- 5 detection modes: Zero Crossing, Flank, Peak, TRIG, DAC
- Automatic TCG for attenuation compensation
- Benchtop-size A-Scan and B-Scan display
- 4 GB memory with A-Scan/B-Scan in alphanumeric batches
- Grid batching with the OBSTRUCT flag for inaccessible positions
- Sequential and grid logging
- Configurable pass/fail limits with audible/visual alarms
- About 18 hours of operation with the Li-Ion pack (12 hours with 6 emergency alkaline AA batteries)
- 12 V / 2 A mains power supply for continuous use in the laboratory
- USB transfer to PC with DakMaster™ software
- Firmware update via USB
- Temperature range: -10 ÷ +60 °C
- NIST-traceable calibration certificate supplied as standard
- EN 12668-1 compliance
Flaw detection modes
The FX81-DL supports the same 5 detect modes as the portable model, essential for compliance with weld inspection standards:
- Zero Crossing: measurement at the first crossing of the x axis after the gate triggers (standard)
- Flank: measurement on the flank of the triggered signal
- Peak: measurement at the signal’s maximum peak
- TRIG: 2D location with angle beam transducers (surface distance + depth, curved surface correction)
- DAC: Distance Amplitude Correction curves for classifying flaws at varying distances
- TCG: automatic Time Corrected Gain
For more on the detect modes and their application in weld inspection, see AWS D1.1 and ultrasonic weld inspection.
Technical specifications
| Parameter | Value |
| Part Number | Z-251-0001 |
| Technical designation | DFX-8+ |
| Function | Flaw Detector + Thickness Gauge |
| Form factor | Benchtop |
| Detection modes | Zero Crossing, Flank, Peak, TRIG, DAC |
| Time Corrected Gain | Yes, automatic |
| A-Scan | Yes |
| B-Scan | Yes |
| Memory | 4 GB internal + up to 64 GB external |
| Logging | Sequential + Grid with OBSTRUCT flag, alphanumeric batches, A/B-Scan for every measurement |
| Pass/fail limits | Configurable with alarms |
| Data output | USB a PC |
| Software | DakMaster™ |
| Firmware update | Via USB |
| Operating temperature | -10 to +60 °C |
| Power supply | Li-Ion pack 10.8 V 2 Ah; 6 × AA for emergency use; 12 V / 2 A power supply |
| Battery life | About 18 h (Li-Ion); with 6 AA: 12 h alkaline / 5 h NiCd / 12 h NiMH |
| Weight | 2.04 kg (batteries included) |
| Dimensions | 216 × 165 × 70 mm |
FX70-DL vs FX81-DL comparison
| Feature | FX70-DL / FX71-DL | FX81-DL |
| Part Number | Z-221-0005 | Z-251-0001 |
| Form factor | Portable | Benchtop |
| Weight | 397 g | 2.04 kg |
| Dimensions | 63.5 × 165 × 31.5 mm | 216 × 165 × 70 mm |
| Batteries | 3 × AA (12h) | Li-Ion (18 h) + 6 × AA for emergency use |
| Detect functions | Identical (Zero Crossing, Flank, Peak, TRIG, DAC, TCG) | |
| Memory | 4 GB internal; on the FX81-DL also up to 64 GB external | |
| Compliance | EN 12668-1 | |
| Ideal scenario | Field inspections | Laboratory, production, training |
Typical applications
- Quality control laboratories in metalworking production
- NDT training centres (certified Level I/II/III courses)
- Weld inspection of components brought to the laboratory
- Quality control of aerospace components before shipment
- Inspection of precision castings and forgings
- Automotive industry: inspection of structural parts and welds
- Rail sector: inspection of axles, wheels and rolling stock components
- Research & Development: characterisation of new materials
- Certification of pressure vessel components before commissioning
- Reverse engineering with retrospective flaw analysis
Recommended application guides:
- AWS D1.1 and ultrasonic weld inspection: requirements and instruments
- Ultrasonic weld inspection to AWS D1.1 with the Dakota FX70-DL
- Data logger vs manual recording
- How to choose the right ultrasonic transducer
- NDT in aerospace: precision measurement on aluminium and titanium
Scope of supply
- Dakota FX81-DL instrument
- Power cable
- Ultrasonic couplant
- User manual
- Rigid carrying case
- NIST traceable calibration certificate
- 6 AA batteries
- USB cable for data transfer
- DakMaster™ software
Note: the transducer is not included. For optimal sizing based on your application, contact us.
Order codes: instrument, probes and accessories
Below you will find everything you can order for the FX81-DL: the instrument, compatible probes, couplants, calibration blocks and accessories. Please quote the order code in your request: it is the code shown on the quotation and on the order confirmation.
The probe is not included with the instrument: it must be chosen and ordered separately from those listed on this page. All probes in the table are compatible with the FX81-DL.
Instrument
Supplied with: FX81-DL instrument, ultrasonic couplant, manual, power cable, plastic carrying case, calibration certificate, AA batteries, PC software and data transfer cable. Probe not included.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | Z-251-0003 | 10-16-27 | FX81-DL flaw detector (DFX-8+) Probe to be ordered separately |
Compatible probes
Flaw detection probes: single-element contact probes (Hi-Wear and Finger Tip) for longitudinal waves, Standard and Quick Change shear-wave angle probes (these require the wedge, see below) and integral probes for welds. Frequency and size are chosen according to the thickness and geometry of the part.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | T-8040-0868 | 10-16-38 | Single-element contact probe Hi-Wear, composite crystal, 1 MHz, Ø 1/2″, BNC connector |
 | T-8070-0868 | 10-16-39 | Single-element contact probe Hi-Wear, composite crystal, 1 MHz, Ø 1″, BNC connector |
 | T-8040-1878 | 10-16-40 | Single-element contact probe Hi-Wear, composite crystal, 2.25 MHz, Ø 1/2″, BNC connector |
 | T-8070-1878 | 10-16-41 | Single-element contact probe Hi-Wear, composite crystal, 2.25 MHz, Ø 1″, BNC connector |
 | T-8040-2878 | 10-16-42 | Single-element contact probe Hi-Wear, composite crystal, 5 MHz, Ø 1/2″, BNC connector |
 | T-8070-2878 | 10-16-43 | Single-element contact probe Hi-Wear, composite crystal, 5 MHz, Ø 1″, BNC connector |
 | T-4023-1855 | 10-15-70 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 1/4″, connector Microdot, side exit |
 | T-4033-1855 | 10-15-69 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 3/8″, connector Microdot, side exit |
 | T-4043-1855 | 10-15-71 | Single-element contact probe Finger Tip, 2.25 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-4023-2855 | 10-15-56 | Single-element contact probe Finger Tip, 5 MHz, Ø 1/4″, connector Microdot, side exit |
 | T-4033-2855 | 10-15-72 | Single-element contact probe Finger Tip, 5 MHz, Ø 3/8″, connector Microdot, side exit |
 | T-4043-2855 | 10-15-73 | Single-element contact probe Finger Tip, 5 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-4023-4855 | 10-15-57 | Single-element contact probe Finger Tip, 10 MHz, Ø 1/4″, Microdot connector, side exit |
 | T-4043-4855 | 10-15-58 | Single-element contact probe Finger Tip, 10 MHz, Ø 1/2″, connector Microdot, side exit |
 | T-5903-2875 | 10-15-75 | Single-element contact probe Finger Tip Slim Line (non-magnetic), 5 MHz, Ø 1/8″, connector Microdot, top exit |
 | T-5903-4875 | 10-15-76 | Single-element contact probe Finger Tip Slim Line, 10 MHz, Ø 1/8″, connector Microdot, top exit |
 | T-8044-1848 | 10-16-44 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 2.25 MHz, 1/2″ x 1/2″ |
 | T-8054-1848 | 10-16-45 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 2.25 MHz, 5/8″ x 5/8″ |
 | T-8044-2848 | 10-16-46 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 5 MHz, 1/2″ x 1/2″ |
 | T-8054-2848 | 10-16-47 | Angle-beam shear-wave probe Standard (SS) High-Gain – requires separate wedge, 5 MHz, 5/8″ x 5/8″ |
 | T-5035-1845 | 10-16-57 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 2.25 MHz, Ø 3/8″, Microdot connector |
 | T-5045-1845 | 10-16-58 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 2.25 MHz, Ø 1/2″, Microdot connector |
 | T-5025-2845 | 10-16-59 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 1/4″, Microdot connector |
 | T-5035-2845 | 10-16-60 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 3/8″, Microdot connector |
 | T-5045-2845 | 10-16-61 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 5 MHz, Ø 1/2″, Microdot connector |
 | T-5025-4845 | 10-16-62 | Angle-beam shear-wave probe Quick Change (QC) High-Gain – requires separate wedge, 10 MHz, Ø 1/4″, Microdot connector |
 | TF4M0045 | 10-15-97 | Integral-wedge shear-wave probe 4 MHz, 45°, Ø 10 mm, Lemo 00 – weld inspection / prove-up |
 | TF4M0070 | 10-16-73 | Integral-wedge shear-wave probe 4 MHz, 70°, Ø 10 mm, Lemo 00 – weld inspection |
 | TF5M00F | 10-16-74 | Dual-element probe 5 MHz, 0°, Ø 10 mm, Lemo 00, short focus – weld lamination testing |
Wedges
Wedges for angle-beam probes: choose the angle and the size of the probe in use.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | X-004-0014 | 10-16-48 | Standard wedge for Standard (SS) shear-wave probes, 45°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0020 | 10-16-49 | Standard wedge for Standard (SS) shear-wave probes, 45°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0015 | 10-16-50 | Standard wedge for Standard (SS) shear-wave probes, 60°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0021 | 10-16-51 | Standard wedge for Standard (SS) shear-wave probes, 60°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0016 | 10-16-52 | Standard wedge for Standard (SS) shear-wave probes, 70°, 1/2″ x 1/2″ Wedge only: probe NOT included |
 | X-004-0022 | 10-16-53 | Standard wedge for Standard (SS) shear-wave probes, 70°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0023 | 10-16-54 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 45°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0024 | 10-16-55 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 60°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0025 | 10-16-56 | Snail-type (AWS) wedge for Standard (SS) shear-wave probes, 70°, 5/8″ x 5/8″ Wedge only: probe NOT included |
 | X-004-0038 | 10-16-63 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 1/4″ Wedge only: probe NOT included |
 | X-004-0041 | 10-16-64 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0044 | 10-16-65 | Standard Quick Change wedge for QC shear-wave probes, 45°, Ø 1/2″ Wedge only: probe NOT included |
 | X-004-0042 | 10-16-67 | Standard Quick Change wedge for QC shear-wave probes, 60°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0045 | 10-16-68 | Standard Quick Change wedge for QC shear-wave probes, 60°, Ø 1/2″ Wedge only: probe NOT included |
 | X-004-0040 | 10-16-69 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 1/4″ Wedge only: probe NOT included |
 | X-004-0043 | 10-16-70 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 3/8″ Wedge only: probe NOT included |
 | X-004-0046 | 10-16-71 | Standard Quick Change wedge for QC shear-wave probes, 70°, Ø 1/2″ Wedge only: probe NOT included |
Cables and power supply
Probe cables, data/analogue output cables and instrument power supply.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | N-250-0001 | 10-16-31 | Power supply 12 V / 2 A with cable 1.8 m |
 | N-110-0470 | 10-16-33 | Analogue output cable 3 m Lemo 1 5 pin – BNC |
 | N-110-0410 | 10-16-34 | Serial output cable 3 m Lemo 1 5 pin – DB9F |
 | N-306-0416 | 10-16-35 | Universal cable (Lemo 1 5 pin – BNC, DB9 1.8 m and 2 alarm outputs 1.8 m) |
 | N-106-0020 | 10-16-36 | Probe cable 1.8 m single Lemo 00 – Microdot |
 | N-106-0100 | 10-16-37 | Probe cable 1.8 m single Lemo 00 – BNC |
 | N-104-0000 | 10-16-03 | Probe cable 1.2 m single Lemo 00 – Lemo 00 (prove-up probes) |
 | TL-31897-60 | 10-16-75 | Probe cable 1.5 m Lemo 00 – Lemo 00 |
Couplants
A couplant is included in the supply; for refills and for high temperatures, choose from the following.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | GEL-ACC-EXT | 12-13-51 | Blue anti-corrosion couplant gel, RCCM compliant. Extended temperature range -20 / 120 °C. 500 ml pack |
 | PST-ACC-MHT | 12-13-52 | Special medium-temperature ultrasonic coupling paste -30 / +300 °C. Non-flammable and smoke-free. RCCM compliant. 170 g pack |
 | PST-ACC-UHT | 12-13-53 | Special very-high-temperature ultrasonic coupling paste +100 / 520 °C. Non-flammable and smoke-free. RCCM compliant. 200 g pack |
 | T92024034-9 | 10-15-82 | High-temperature ultrasonic couplant (370 °C), 60 ml |
 | T92024034-10 | 10-15-83 | High-temperature ultrasonic couplant (370 °C), 60 ml, pack of 2 |
Accessories and spare parts
Cases, cables and accessories specific to this instrument.
| Image | Order code | SKU | Description |
|---|---|---|---|
 | F-250-0006 | 10-16-28 | Nylon instrument case con cinghie (FX81, BT2-DL / MAX II) Case only: instrument NOT included |
 | A-250-6002 | 10-16-29 | Plastic carrying case (FX81, BT2 / MAX II) Case only: instrument NOT included |
 | B-040-3200 | 10-16-30 | Lithium-ion battery pack |
 | N-506-0060 | 10-16-32 | Universal power cable |
For more on choosing the probe: probes for flaw detectors and the guide How to choose the right ultrasonic transducer. For a quotation, please state the order code and quantity.
Documentation download
Official Dakota NDT technical documentation. Files open in a new tab.
Standards and certifications
- EN 12668-1 — ultrasonic flaw detection equipment
- NIST traceable factory calibration
- MIL-STD-45662A compliance
- CE marking and EMC compliance
- Thickness gauge mode compliant with ASTM E797 and EN 14127
- Calibration certificate supplied as standard
Frequently asked questions
It depends on the operating scenario. For field inspections or awkward positions the portable FX70-DL is unbeatable. For predominantly laboratory use, production quality control, training or inspection of components brought to the bench, the FX81-DL offers greater ergonomics and battery life. Many organisations adopt both to cover every scenario, with data interchangeable through DakMaster™.
Not necessarily. It runs on the Li-Ion pack (about 18 hours) or, in an emergency, on 6 AA batteries. At a fixed workstation it is powered from the mains with the 12 V / 2 A power supply.
Yes. The FX81-DL supports TRIG mode for 2D location with angle beam transducers and DAC mode for flaw classification, both required for weld inspection to AWS D1.1. It is also EN 12668-1 compliant for European regulatory conformity.
Yes. The A-Scans and B-Scans stored in memory are transferred via USB to the PC and analysed with DakMaster™, which allows export in standard formats for professional reports. Every measurement is linked to an alphanumeric batch with a date/time stamp for full traceability.
In grid batching mode, the operator can flag inaccessible positions with the OBSTRUCT flag instead of leaving them empty. This preserves the consistency of the inspection grid and lets the final report correctly document the areas that cannot be measured — something many structural inspection standards require.
Request a tailored quotation for the Dakota FX81-DL
We will help you choose the most suitable transducers and configure the kit for your laboratory. Contact us for dedicated technical advice or to arrange a demonstration.
Further information and contacts
Systems division and sensor integration partner : www.roder.it
More information about RODER SRL : about us
Contact for general information : info@roder.it
Contact for information about these products : info@roder.it
The information contained on this web page is provided for information purposes only. Although it has been compiled with the utmost care, it does not constitute a contractual offer or a binding commitment to supply. It may contain transcription, translation or typographical errors. For precise and up-to-date information, please contact our company directly.
Some images on this website have been intentionally generated using Artificial Intelligence (AI). This is because, for many applications and projects, it is not possible to disclose photographs of the installation or of the actual system due to confidentiality agreements, confidentiality clauses and non-disclosure agreements (NDAs).