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DakView™: A-Scan and B-Scan analysis on a PC for advanced inspections

Dakota NDT CMX10-DL ultrasonic instrument with dual element probe

DakView™ is the Dakota NDT software for analysing on a PC the A-Scan and B-Scan waveforms acquired by ultrasonic instruments. Available for Windows 32/64 bit and Mac OS X, it allows post-inspection review, validation of critical measurements and integration into code-based inspection workflows.

DakView™ (currently in version 4) is the Dakota NDT software dedicated to analysing the ultrasonic waveforms acquired by thickness gauges and flaw detectors. Available for Windows (32 and 64 bit) and Mac OS X (64 bit), according to the official download portal, DakView is the analytical complement to DakMaster™: where DakMaster manages data and reports, DakView focuses on the graphical interpretation of the A-Scan and B-Scan signal.

A-Scan display with DakView

What DakView is and what it is for

High-end Dakota instruments — the CMX, MX2-DL, PMX, PCX, FX series — record not only the numerical value of the measurement but also the complete waveform associated with each reading. This waveform contains far more information than the digital reading alone: the position of the echoes, their amplitude, the shape of the returning signal. DakView is the software that lets you review these waveforms on a PC after the inspection, analyse them with dedicated tools and document any anomalies.

Availability and compatibility

According to the Dakota NDT download portal, DakView4 is available in three versions:

  • DakView4 32 bit for Windows PC — compatibility with older Windows systems
  • DakView4 64 bit for Windows PC — recommended version for modern systems
  • DakView4 64 bit for Mac OSX — for users working in the Apple environment

The software is published as a free download on the Dakota website after completing a registration form. Dakota also provides dedicated software for certain specific instruments (e.g. MultiUI for the MultiMax monitor).

A-Scan waveform analysed on a PC

Why analyse waveforms on a PC

The display of a portable instrument, however detailed, has inherent size limitations. Reviewing on a PC the A-Scans acquired in the field allows:

  • Higher-resolution analysis: larger screens reveal details that can be missed on the portable display
  • Zooming in on intermediate echoes: to assess the presence of flaws, inclusions and delaminations that a quick interpretation in the field might overlook
  • Comparison between measurements: placing A-Scans from different locations side by side to identify anomalies or repeated patterns
  • After-the-fact validation of critical measurements: checking that the measured echo really corresponds to the back wall and not to an inclusion
  • Technical documentation: exporting waveform images for inclusion in inspection reports
  • Review by qualified personnel: a Level 3 UT can validate the work of a Level 2 by reviewing the A-Scans afterwards

Typical usage scenarios

Flaw detector with A-Scan for post-inspection analysis
  • UT weld inspections (AWS D1.1, EN ISO 17640): the A-Scans of each indication can be stored and reviewed for flaw classification
  • Corrosion monitoring with PECT (Pulse-Echo Coating Through mode): the complex waveforms typical of coated materials are easier to interpret on a large display
  • Inspections in difficult conditions (attenuating materials, cast iron, coarse-grained alloys): reviewing afterwards helps to distinguish real echoes from grain noise
  • Hands-on training: a valuable teaching tool for training new inspectors by having them analyse real A-Scans
  • Quality audits: the quality manager can spot-check the waveforms acquired by the inspectors

DakView and DakMaster: how to use them together

DakView and DakMaster™ are designed to be used in a complementary way in the professional workflow:

  • DakMaster™ for: project organisation, data management, report generation, export to Excel/PDF
  • DakView4 for: technical waveform analysis, checking the interpretation, reviewing critical measurements
  • The typical flow is: data download with DakMaster → analysis of critical A-Scans with DakView → production of the final report with DakMaster

Instrument firmware updates

For (older) Dakota instruments with a serial interface, DakView4 includes the flash programmer needed to update the instrument firmware. For newer instruments with USB-C connectivity, the firmware update does not require DakView: the file is downloaded from the Dakota portal and copied to the instrument’s SD memory, and the update is started from the XFER menu.


For assistance with installing and using DakView4, and with updating the firmware of Dakota instruments, contact our technical department.

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